ANSI EIA-364-17B-1999 pdf download Temperature Isife with or without Electrical Load Test Procedure for ] Electrical Connectors and Sockets
1 Introduction
1.1 Scope
This standard establishes a test method to determine the ability of an electrical connector and sockets to withstand elevated temperatures with or without electrical loading.
1.2 Atmospheric pressure
This procedure for elevated temperature is performed at ambient pressure. High altitude and space vacuum applications may require testing at reduced pressure as required by the referencing ocument.
2 Test resources
2.1 Equipment
A suitable air circulating chamber and equipment shall be used that will maintain, monitor and ecord the test temperature to the tolerance and for the duration specified. For method B and C the chamber size or capacity shall be such that the connector under test shall be capable of disspating the intemally generated (I’R) connector heat.
3 Test specimen
3.1 Preparation
The specimen shall be fully assembled, mated with the specified number of contacts. Proper wire type, size, and preparation, sealing plugs, other hardware, and test boards shall be as specified in the referencing document.
3.1.1 Without electrical load Unless otherwise specified in the referencing document, the specimens, test boards, wires, and fixtures shall be normally positioned in the chamber so that there will be no retriction of the air flow.
3.1.2 With electrical load Unless otherwise specified in the referencing document, the specimens shall have the same size contacts wired in a series circuit. The test specimens shall be suitably ftted with temperature sensing device(s), wired and mounted as specified in the referencing document. See EIA-364-70 for further instructions and spacing requirements. The chamber temperature measurements shall be made in a manner that will indicate the connector exposure temperature rather than the chamber source temperature.
4 Test procedure
4.1 Method A, without electrical load
The connector specimen shall be subjected to the chamber temperature specified in table 1 for the test condition number and test duration specified in the referencing document; see 4.3.
4.2 Method B, with electrical load for connectors
4.2.1 The test specimen rated current shall be applied until stabilization is reached.
4.2.2 The chamber temperature shall be increased until the specified test temperature is obtained (temperature rise + chamber temperature = specified test temperature).
4.2.3 The chamber temperature shall be recorded and maintained for the specified duration;see 4.3.