ANSI EIA 364-33A-2002 pdf download Inductance Measurement Test Procedure for Electrical Connectors (100 nH – 100 mH)
2.2 Fixture
The test fixture shall be a mechanically stable assembly. The spacing between test points should be adjustable to accept the specimen without the use of additional conductors.
NOTES
1 One-piece connectors require the use of a special fixture to allow connection to the measuring equipment.
2 It is recommended that the fixtures provided by the equipment manufacturer be used as they typically improve measurement accuracy.
3 Test specimen
3.1 Description
The test specimen shall consist of the following:
an individual contact;
a mated contact assembly that would normally be installed in a connector;
one-piece connectors (e.g. card edge connectors or chip sockets);
mated two-piece connectors.
4 Test procedure
4.1 The inductance of at least three specimens shall be measured unless otherwise specified in the referencing document. In the case of multi-contact connectors, at least three specimens of each type of contact from at least three connector specimens shall be measured unless otherwise specified in the referencing document. For pin and socket contacts the depth of engagement shall be the nominally designed engagement depth unless specified in the referencing document.
4.2 The point of measurement shall be between the termination points of the specimen.
4.3 Adjust the spacing of the test fixture test points to accept the specimen.
4.4 Set the test equipment to the desired measurement frequency. Unless otherwise specified in the referencing document, a measurement frequency of 1 MHz is recommended.
4.5 Record the value indicated by the test equipment.
NOTE When external test leads are used to connect to the specimen, the measured inductance is increased. Test lead inductance shall be subtracted from the measured value.
5 Details to be specified
The following details shall be specified in the referencing document:
5.1 Specimen description and measurement points
5.2 Depth of engagement for pin and socket contacts if other than nominally designed engagement depth.
5.3 Test frequency(s) to be used, if other than 1 MHz
5.4 Special fixture requirements, if any
5.5 Output format (e.g. Inductance versus frequency plots or tabular listing of data)
5.6 Quantity of specimens (and/or contacts within the specimen) to be measured
6 Test documentation
Documentation shall contain the details specified in clause 5, with any exceptions, and the following:
6.1 Title of test
6.3 Test equipment used, and date of last and next calibration
6.4 Method of mounting test specimen to test fixture
6.5 Ambient temperature and humidity
6.6 Measured values and test frequency(s)
6.7 Name of operator and date of test