BS/EN 50131-10-2014 pdf download.Alarm systems Intrusion and hold-up systems Part 10: Application specific requirements for Supervised Premises Transceiver (SPT).
10.2.1 Laboratory conditions and tolerance
Testing conditions shall be in accordance with EN 60068-1:1994. 5.3.1. as follows:
— temperature: 15 ‘C to 35 ‘C;
— relative hum idity 25 % to 75 %;
— air pressure: 86 kPa to 106 kPa.
10.2.2 Mounting
Except where shown otherwise, the SPT shall be mounted in accordance with the manufacturers installation instructions. For environmental testing, the EUT shall be mounted in its correct operational orientation. The material used for the mounting surface shall not influence the test results.
The manufacturer shall supply any additional equipment necessary to carry out the tests by agreement with the test house.
All input signals/messages (e.g. inputs or bus line from CIE) shall be correctly terminated according to the manufacturer’s instructions.
10.2.3 Reduced functional test
For the purposes of performing the environmental tests (10.7) and impact tests (10.3.1), a reduced functional test shall be applied. The reduced functional test shall be as required by EN 50136.2. For SPT with type C PS, this reduced functional test also applies (see 10.5.3).
NOTE I The reduced functional test includes transmission of at least one alarm and verification that transmission has been correct and successful.
Where power for the SPT is provided by an integral PS of type A or B, the reduced functional test shall be carried out with the EPS at nominal value, and with the APS at a level of at least 80 % of full capacity and connected according the manufacturer’s instructions. For an SPT requiring a type C PS. the SD shall be at a level of at least at 80 % of full capacity.
NOTE 2 The description of the type (A, B or C) of PS can be found In EN 50131-1.
Where it is intended that power for the SPT be provided by a separate PS, the reduced functional test shall be carried out using a PS with sufficient current and at the nominal voltage as declared in the manufacturer’s documentation.
10.2.4 Documentation
The product documentation (as required in Clause 8) shall be provided with the SPT.
10.2.5 Additional equipment
When, for test purposes, the manufacturer supplies additional equipment, the manufacturer shall also supply connecteon drawings, operational description and instructions for use (e.g. CIE simulator to verify tamper detection outputs).
10.3 Tamper security tests
10.3.1 Tamper protection
10.3.1.1 Principle
The principle of this test is to use impact testing to verify that the SPT housing meets the tamper
protection requirements of 7.1.2.
For Type Y and Z SPT, the tamper test procedure detailed In EN 50131-3 or EN 50131-6 (as applicable to the housing used) shall apply.
10.3.1.2 Procedure
Subject the SPT housing to impact testing using the methodology of EN 50130-5, with equipment
meeting the requirements of EN 60068-2-75 at the severity levels specified in 7.1.2.
10.3.1.3 Measurement
Assess the EUT as described in the reduced functional test in 10.2.3.
10.3.1.4 Pass/fail criteria
The EUT shall meet the requirements of the reduced functional test before, during and after the test. The generation of signals or messages is permitted as a result of this test.
There shall be no signs of mechanical damage that will permit access to internal elements of the SPT housing unless a tamper signal or message has been generated.
10.3.2 Tamper detection — Access to the inside of the housing
10.3.2.1 Principle
The principle of this test is to verify that it is not possible to insert a tool into the SPT in its normal mounting position and defeat the operation of the tamper detection circuitry before a tamper signal or message is generated (see 7.1.3.2).
10.3.2.4 Procedure
For Type X SPT open the SPT housing by normal means, whilst attempting to introduce a sabotage tool as specified in 7.1.3.2. into the EUT without causing physical damage before the tamper detection device operates.
NOTE The tool may be inserted through any aperture, before or during the pcocess of opening the housing. For Grades 3 and 4, this includes apertures for indicators and operating controls that are accessible to a level 1 user.
If the tool is successfully inserted, it shall be manoeuvred to try to interfere with the tamper detection device. The wire test includes forming the wire as appropriate.
Attempts shall be restricted to 5 minutes per tool (10 minutes for Grade 4). If the test fails, it shall be repeated, and a further failure within 4 further attempts shall result in the overall test failing.
10.3.2.5 Measurement
Record the generation of the tamper signal or message.
10.3.2.6 Passlfail criteria
Opening the SPT by normal means shall only be possible by following the procedure defined by the manufacturer and shall generate a tamper signal or message.
Either, the tamper detection device shall not have been defeated before the generation of a tamper signal or message. or visible damage has been caused in order to defeat the tamper detection device.
10.3.3 Tamper detection — Removal from mounting
10.3.3.1 PrInciple
The principle of this test consists of removing the SPT from its mounting surface and monitoring the EUT to determine whether a tamper signal or message is generated within the required time period when the maximum permitted distance (see 7.1.3.3) is exceeded.
For Type V and Z SPT, the tamper test procedure detailed in EN 50131-3 or EN 50131-6 (as applicable to the housing used) shall apply
10.3.3.2 Test conditions
The SPT shall be functional (i.e. powered).
Test operatives should take care to avoid personal injury.BS/EN 50131-10-2014 pdf download.